A scanning electron microscope (SEM) is a type of electron microscope that produces high resolution images of
surface of a sample by scanning it with a focused beam of electrons.
The instrument has two parts, the Scanning Electro Microscope (SEM) is the main instrument using for taking high
resolution microphotogrphs in different mode e.g. SE, BSE, CL etcand Energy Dispersive X-Ray (EDX)
is an attachment for qualitative and semi-quantitative microanalysis. |
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Existing Locations:
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NCEGR, Kolkata
Additional Director General
National Mission Head-IV
Central Headquater
Geological Survey of India
15 A & B Kyd Street
Kolkata-700016
Fax- 033-22861716
Email- hodm4@gsi.gov.in
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GSI,SR, Hyderabad
Additional Director General & HOD
Southern Region
Geological Survey of India
GSI Complex, Bandlaguda,
Hyderabad-500068
Andhra Pradesh
Fax-040-24220958
Email- hod.sr@gsi.gov.in
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GSI, CR, Nagpur
Additional Director General & HOD
Central Region
Geological Survey of India
GSI Complex, Seminary Hills,
Nagpur-440006, Maharashtra
Fax- 0712-2511671
Email- hod.cr@gsi.gov.in |
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